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首页> 外文期刊>IEEE Transactions on Nuclear Science >Large area thin film semiconductor detectors using multichannel counting Castor readout chip
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Large area thin film semiconductor detectors using multichannel counting Castor readout chip

机译:使用多通道计数Castor读出芯片的大面积薄膜半导体探测器

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摘要

The performance of charged particle counters associating thin diamond or amorphous silicon (a-Si) detectors to Castor VLSI analog-digital circuits for the fabrication of large area detectors an reported. The 20 /spl mu/m thick semiconductor detectors were synthesised using chemical vapour deposition (CVD) technique. Detectors of 2.5/spl times/2.5 cm/sup 2/ area were segmented in 32 sub-areas of 13 mm/sup 2/ in order to limit the electronic noise per reading channel. The 32 channel circuit was used to record the counting rate and the total number of counts on each segment. Such detection systems were tested under alpha particles (/sup 241/Am) as well as under low energy beta particles (/sup 14/C). The results show that large area detection systems can readily be fabricated at low cost by the association of an application specific readout chip (ASIC) with chemically vapour deposited semiconductor detectors.
机译:据报道,带电粒子计数器将薄金刚石或非晶硅(a-Si)检测器与Castor VLSI模拟数字电路相关联的性能,用于制造大面积检测器。使用化学气相沉积(CVD)技术合成了20个/ splμm/ m厚的半导体探测器。将2.5 / spl次/2.5 cm / sup 2 /区域的检测器分为13个mm / sup 2 /的32个子区域,以限制每个读取通道的电子噪声。 32通道电路用于记录计数率和每个段上的计数总数。在α粒子(/ sup 241 / Am)和低能β粒子(/ sup 14 / C)下测试了此类检测系统。结果表明,通过将专用读出芯片(ASIC)与化学气相沉积的半导体检测器相结合,可以很容易地以低成本制造大面积检测系统。

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