X-ray detection characteristics of thallium bromide nuclear radiation detectors

摘要

Semiconductor X-ray detectors have been fabricated from high purity TlBr crystals grown by the traveling molten zone method. X-ray detection characteristics of the TlBr detectors in the individual quantum pulse mode as well as in the current mode have been studied. An energy resolution of 2.5 keV FWHM has been recorded for 22 keV X-rays with a TlBr detector operated in the individual quantum pulse mode at room temperature. The TlBr detectors in the current mode have been tested as flux detectors for an X-ray CT scanner system of a first generation type. The performance of the system has been tested using a wooden phantom. The X-ray CT system has shown good imaging capabilities.