Neutron-Induced Single Event Effects Testing Across a Wide Range of Energies and Facilities and Implications for Standards

摘要

Neutron test data on single event effects for a wide range of SRAMs, facilities (monoenergetic and continuum) and energies (thermal to 800 MeV) are compared. Many modern devices are found to be sensitive to thermal neutrons and rates from this source can dominate in many situations. A significant number of devices suffer latchup and the cross-sections increase with operating voltage and beam energy implying that most test facilities will underestimate the problem for the natural atmospheric environment. Upset sensitivity at 3-5 MeV varies from 5 to 600 less than at high energies and will be of most significance for sources of fission neutrons. These results are related to current and developing standards