First Record of Single-Event Upset on Ground, Cray-1 Computer at Los Alamos in 1976

摘要

Records of bit flips in the Cray-1 computer installed at Los Alamos, NM, in 1976 lead to an upset rate in the Cray-1's bipolar SRAMs that correlates with the single-event upsets (SEUs) being induced by the atmospheric neutrons.