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Experimental Evaluation of Material Identification Methods With CdTe X-ray Spectrometric Detector

机译:CdTe X射线光谱检测器材料鉴定方法的实验评估

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This paper aims to experimentally evaluate a new material multidimensional method for material identification using a new CdTe spectrometric detector. LETI has developed a 16-channel fast read-out system capable of taking spectrometric measurements at count rates of more than $10^{7}~{rm counts}/{rm s}$. This read-out system was coupled to CdTe linear array pixel detectors. A multidimensional analysis of the measured spectra has been conducted to perform material identification. The results show a decrease in false detection rate by a factor of up to 2 compared to an optimized dual counting approach applied on the same spectrometric raw data. Compared to a sandwich detector, the false detection rate decreases by a factor of more than 3 for thin objects. As a rule, the paper quantitavely demonstrates the continuous increase in performance and robustness with the number of detector energy counters.
机译:本文旨在通过实验评估使用新的CdTe光谱检测器进行材料识别的新材料多维方法。 LETI开发了一种16通道快速读出系统,该系统能够以大于 $ 10 ^ {7}〜{rm counts} /的计数率进行光谱测量。 {rm s} $ 。该读出系统与CdTe线性阵列像素检测器耦合。已对测量光谱进行了多维分析,以进行材料识别。结果表明,与应用于相同光谱原始数据的优化双重计数方法相比,错误检测率降低了多达2倍。与三明治检测器相比,对于薄物体,错误检测率降低了三倍以上。通常,本文定量地证明了随着探测器能量计数器数量的增加,性能和鲁棒性不断提高。

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