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首页> 外文期刊>IEEE Transactions on Microwave Theory and Techniques >Characterization of microstrip lines near a substrate edge and design formulas of edge-compensated microstrip lines (MMICs)
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Characterization of microstrip lines near a substrate edge and design formulas of edge-compensated microstrip lines (MMICs)

机译:靠近基板边缘的微带线的表征和边缘补偿微带线(MMIC)的设计公式

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摘要

The proximity effects of microstrip lines near a substrate's edge present a problem for effectively designing high-packing-density MMICs (monolithic microwave integrated circuits). Proximity effects of this type are analyzed using the rectangular boundary division method. It is assumed that the cross-sectional dimensions of transmission lines in the MMICs are small compared with the wavelengths to allow the use of the quasi-TEM-wave approximation. Then, the concept of edge-compensated microstrip lines to keep the characteristic impedance constant near a substrate edge is introduced to circumvent the proximity effects and to expand the interconnection flexibility of microstrip lines on MMIC substrates. The practical design parameters of edge-compensated 50- Omega microstrip lines are given in the form of numerical data and simple polynomials for CASD (computer-aided design) work with a curve-fitting procedure. Results of capacitance measurements are compared with this theory with errors of about 1% resulting.
机译:微带线在基板边缘附近的邻近效应为有效设计高封装密度MMIC(单片微波集成电路)提出了一个问题。使用矩形边界划分方法分析这种类型的邻近效果。假定与波长相比,MMIC中传输线的横截面尺寸较小,以允许使用准TEM波近似。然后,引入了边缘补偿微带线的概念,以使特性阻抗在衬底边缘附近保持恒定,从而避免了邻近效应并扩大了MMIC衬底上微带线的互连灵活性。边缘补偿的50Ω微带线的实用设计参数以数值数据的形式给出,并且CASD(计算机辅助设计)的简单多项式通过曲线拟合程序进行工作。将电容测量结果与该理论进行比较,结果误差约为1%。

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