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Improving microwave imaging by enhancing diffraction tomography

机译:通过增强衍射层析成像来改善微波成像

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摘要

In this paper, a technique for enhancing the reconstruction quality of diffraction tomography for microwave imaging is presented. The technique invokes the WKB approximation in conjunction with utilizing measurement data at more than one frequency to overcome some of the limitations of diffraction tomography. The resulting formulation has a mathematical interpretation which leads to some interesting insights into the limitations of diffraction tomography. Numerical implementation of the technique is also described and actual simulation results using this implementation for a variety of two-dimensional (2-D) objects are provided. These show that indeed significant improvements over conventional diffraction tomography are possible with our enhanced technique.
机译:本文提出了一种提高微波成像衍射层析成像重建质量的技术。该技术结合使用一种以上频率的测量数据来调用WKB近似,以克服衍射层析成像的某些局限性。所得的公式具有数学解释,可得出一些有趣的见解,以了解衍射层析成像的局限性。还描述了该技术的数值实现,并提供了使用该实现针对各种二维(2-D)对象的实际仿真结果。这些表明,利用我们的增强技术,与传统的衍射层析成像相比,确实可以实现重大改进。

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