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K-Space Analysis of Aliasing in Millimeter-Wave Imaging Systems

机译:毫米波成像系统混叠的k空间分析

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This article focuses on analyzing the aliasing artifact in millimeter-wave imaging systems, with a special focus on multistatic arrays. The current framework to analyze the behavior of multistatic structures is based on the effective aperture concept. Based on this framework, an equivalent monostatic array, approximating the position of each transmitter-receiver pair by its midpoint, is used to quantify the response and efficiency of the system. Although this framework helps to simplify the study of the complex characteristics of multistatic arrays, it suffers from vital deficiencies. Especially, it fails to describe the aliasing artifacts, seen in the image of some sparse multistatic configurations, where the study of their equivalent monostatic arrays proves that the Nyquist sampling rate is satisfied. In order to explain such behaviors, we propose a k-space-based framework to evaluate multistatic imaging systems. This framework not only explains the reason behind the aliasing artifacts but also estimates the locations where the aliasing happens. Moreover, this analysis can be beneficial to design multistatic configurations with reduced aliasing artifacts. The provided simulations and the experimental results prove the accuracy of the proposed framework that can effectively estimate the occurrence and the place of aliasing artifacts.
机译:本文侧重于分析毫米波成像系统中的混叠工件,特别关注多个阵列。分析多晶体结构行为的当前框架基于有效的孔径概念。基于该框架,使用其中点近似于每个发射机接收器对的位置的等效单体阵列来量化系统的响应和效率。虽然该框架有助于简化多个阵列复杂特性的研究,但它受到了重要的缺陷。特别是,它未能描述在一些稀疏多晶片配置的图像中看到的混叠伪像,其中它们的等效单体阵列的研究证明了奈奎斯特采样率满足。为了解释此类行为,我们提出了一种基于K空间的框架来评估多静学成像系统。该框架不仅解释了混叠工件背后的原因,还估计了混叠发生的位置。此外,该分析可能有利于设计具有减少的混叠伪影的多晶体配置。所提供的模拟和实验结果证明了所提出的框架的准确性,可以有效地估计发生锯齿伪像的发生和地点。

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