首页> 外文期刊>Microwave Theory and Techniques, IEEE Transactions on >Calibrated Layer-Stripping Technique for Level and Permittivity Measurement With UWB Radar in Metallic Tanks
【24h】

Calibrated Layer-Stripping Technique for Level and Permittivity Measurement With UWB Radar in Metallic Tanks

机译:用于金属罐中UWB雷达的液位和介电常数测量的校准层剥离技术

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

A method to measure liquid level and electrical properties based on ultra-wideband pulsed radar is developed in this paper. Current methods of material property measurement using free-space radar typically use computationally intensive frequency-domain analysis or finite time-domain methods. The method presented is modified from layer-stripping algorithms and includes several improvements over previous techniques, such as an antenna array that allows measurement in a metallic tank environment and a method of calibration that characterizes path-loss and near-field effects for accurate amplitude-distance prediction. The method presented here also estimates the material loss properties and uses accumulated power with noise compensation to predict reflected pulse power. The method extends the use of pulsed radar for liquid-level measurement in tanks to the evaluation of liquid permittivity and the estimation of liquid height in liquids consisting of multiple layers. The accuracy of the presented method is evaluated using a transmitting single antenna element, a four-element antenna array, and an eight-element antenna array for measurement in a metallic tank environment. Accuracy is improved with larger antenna arrays, but the calibration becomes more critical. The accuracy for varying layer heights and materials is investigated to demonstrate the method reliability.
机译:提出了一种基于超宽带脉冲雷达的液位和电性能测量方法。当前使用自由空间雷达进行材料性能测量的方法通常使用计算密集型频域分析或有限时域方法。提出的方法是根据分层剥离算法进行修改的,它包括对以前技术的一些改进,例如允许在金属罐环境中进行测量的天线阵列以及可以表征路径损耗和近场效应以实现精确幅度校正的校准方法。距离预测。此处介绍的方法还估算了材料损失的特性,并使用带有噪声补偿的累积功率来预测反射脉冲功率。该方法将脉冲雷达在罐内液位测量中的应用扩展到液体介电常数的评估和多层液体中液体高度的估计。使用发射单天线元件,四元件天线阵列和八元件天线阵列评估提出的方法的准确性,以在金属罐环境中进行测量。使用更大的天线阵列可以提高精度,但是校准变得更加关键。研究了不同层高和材料的精度,以证明该方法的可靠性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号