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首页> 外文期刊>Microwave Theory and Techniques, IEEE Transactions on >Shifted Source Impedance and Nonlinearity Impact on RFID Transponder Communication for Drive-Level Offsets
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Shifted Source Impedance and Nonlinearity Impact on RFID Transponder Communication for Drive-Level Offsets

机译:偏移源阻抗和非线性对驱动器级偏移的RFID应答器通信的影响

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摘要

A measurement and analysis method to quantify the communication quality for ultrahigh-frequency radio frequency identification (RFID) transponder chips under a shifting source environment is presented. A detailed description of theory, setup, and procedure is provided. The differences in on/off impedance (-value) of the transponder chip are critical for backscatter modulation and, therefore, the overall communication and transponder response. In the present work, a new quantity which includes the difference in on/off impedance, as well as arbitrary source impedance, is defined as an overall figure of merit. A qualitative analysis, considered as novel in the RFID community, shows the impact a source impedance shift has on the communication quality. The bare chip measurement setup enables an ASK modulated wake up signal, realized as a pulse train. The chip response consisting of modulated impedance states are measured in a pulse profile setup. Results show that different degrees of nonlinearity in a transponder chip, depending on vendor and type, will have impact on the communication performance.
机译:提出了一种在移动源环境下量化超高频射频识别(RFID)应答器芯片通信质量的测量和分析方法。提供了理论,设置和过程的详细说明。应答器芯片的开/关阻抗(-值)的差异对于反向散射调制至关重要,因此对于整体通信和应答器响应至关重要。在本工作中,将包括导通/截止阻抗之差以及任意源阻抗的新量定义为总体品质因数。定性分析在RFID界被认为是新颖的,它显示了源阻抗偏移对通信质量的影响。裸芯片测量设置可启用ASK调制的唤醒信号,实现为脉冲序列。由调制阻抗状态组成的芯片响应在脉冲轮廓设置中进行测量。结果表明,取决于供应商和类型,应答器芯片中不同程度的非线性会影响通信性能。

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