...
首页> 外文期刊>IEEE Transactions on Microwave Theory and Techniques >Influence of Metallic Shielding on Radio Frequency Energy-Induced Heating of Leads With Straight and Helical Wires: A Numerical Case Study
【24h】

Influence of Metallic Shielding on Radio Frequency Energy-Induced Heating of Leads With Straight and Helical Wires: A Numerical Case Study

机译:金属屏蔽层对直线和螺旋线导线射频能量感应加热的影响:数值案例研究

获取原文
获取原文并翻译 | 示例

摘要

Heating induced by radio frequency (RF) energy may appear in tissues near implants located in a human subject undergoing magnetic resonance imaging examination. Lead shielding was proposed to reduce such heating below dangerous levels. In this article, we employed 3-D electromagnetic (EM) and thermal co-simulations to quantify the effectiveness of metallic shielding in the presence of two large sets of nonuniform incident fields at 128 MHz. Specifically, we used a lead EM model (LEM) and computed the RF responses, i.e., the net dissipated power and net temperature increase, above background, at the electrodes. We considered a set of single electrode leads with both straight and helical wires, comparing regular unshielded configurations to different implementations of a metallic shield. The lead length, the relative permittivity of the insulator material, and the lead electrode geometry were all independently varied. For leads with helical wires we observed that: 1) the metallic shield significantly modified the LEM; 2) in most cases, the RF responses substantially increased if metallic shielding was applied; and 3) the net temperature increase in close proximity to the shield can be substantially higher than the net temperature increase in close proximity to the lead electrode. Leads with helical and straight wires exhibited significantly different behavior. Using the results obtained from generic straight wire leads to predict the results for leads with helical wires can be significantly misleading.
机译:由射频(RF)能量引起的加热可能会出现在位于接受磁共振成像检查的人体中的植入物附近的组织中。建议使用铅屏蔽以将这种热量减少到危险水平以下。在本文中,我们使用3-D电磁(EM)和热协同仿真来量化在存在两组大型,128 MHz非均匀入射场的情况下金属屏蔽的有效性。具体来说,我们使用前导EM模型(LEM)并计算了RF响应,即电极上方的净耗散功率和净温度升高(高于背景温度)。我们考虑了一组具有直导线和螺旋导线的单电极引线,将常规的非屏蔽配置与金属屏蔽的不同实现方式进行了比较。引线长度,绝缘体材料的相对介电常数和引线电极的几何形状均独立变化。对于带有螺旋线的导线,我们观察到:1)金属屏蔽层显着改变了LEM; 2)在大多数情况下,如果应用金属屏蔽,则RF响应会大大增加; 3)紧邻屏蔽层的净温度升高可能远高于靠近引线电极的净温度升高。带有螺旋线和直线的导线表现出明显不同的行为。使用从普通直导线引出的结果来预测螺旋导线引出的结果可能会产生重大误导。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号