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Characterization of the Reader Width Using the Micro-Track Test in Perpendicular Recording

机译:在垂直记录中使用微径测试对读取器宽度进行表征

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Micro-track test is a valuable tool used to characterize the electrical reader width in perpendicular recording. The test is based on trimming both sides of a track written with a single tone and followed by a cross-track scan of the remaining track. The reader cross-track profile or read sensitivity function is characterized by a narrow band measurement of the read-back signal as a function of cross-track position. With increasing track density, the signal amplitude decreases due to incomplete media saturation and to an increase in the off-track noise due to percolation and opposite polarity media saturation. These effects cause a lump at the edge of the micro-track profile that changes the width of the profile (MT10 and MT50). Micro-magnetic analysis indicates that the off-track demagnetization field creates a track-edge section in the media with opposite polarity relative to the originally written track. This section is coherent with the main track and decreases the read-back signal during the scan of the micro-track. Consequently, the shape of the cross-track read sensitivity function becomes distorted, causing a reduction in MT10 and a side lump. The solution to this problem is to increase the amplitude of the micro-track read-back signal by reduced trimming and by the use of a higher density (KFCI) in the main track that minimizes the off-track demagnetization field. These test improvements are shown to preserve the integrity of the micro-track profile and to enable an accurate measurement of MT10 and MT50. Optimizing reader and writer widths in perpendicular recording requires an accurate measurement of these parameters.
机译:微径测试是用于表征垂直记录中电子阅读器宽度的一种有价值的工具。该测试基于修剪以单一音调书写的轨道的两侧,然后对剩余轨道进行跨轨道扫描。读取器跨磁道轮廓或读取灵敏度函数的特征在于,根据跨磁道位置对回读信号进行窄带测量。随着磁道密度的增加,由于介质不完全饱和以及由于渗流和极性相反的介质饱和而导致的磁道外噪声增加,信号幅度减小。这些影响会导致微轨道轮廓的边缘发生团块,从而改变轮廓的宽度(MT10和MT50)。微磁分析表明,磁道外消磁场在介质中创建了一个磁道边缘部分,其极性与原始写入的磁道相反。该部分与主磁道相干,并在微磁道扫描期间减小了回读信号。因此,跨磁道读取灵敏度函数的形状变得失真,从而导致MT10的减小和侧面肿块。该问题的解决方案是通过减少修整并在主磁道中使用较高的密度(KFCI)来最大程度地减小磁道退磁场,从而增加微磁道回读信号的幅度。这些测试改进表明可以保留微轨道轮廓的完整性,并能够精确测量MT10和MT50。在垂直记录中优化读写器宽度需要对这些参数进行精确测量。

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