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Effect of grain isolation on media noise in thin-film longitudinal media

机译:颗粒隔离对薄膜纵向介质中介质噪声的影响

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Particulate media exhibit low media noise as compared to thin-film longitudinal media. The main source of media noise in thin-film longitudinal media is the zig-zag transitions which occur due to a strong magnetic coupling between neighboring grains. Thus, if the grains in thin-film longitudinal media can be isolated, the media noise should be decreased. In order to alter the magnetic coupling across grain boundaries, CoNiCr/Cr films of different microstructures were prepared by changing the Cr underlayer microstructure. SEM analysis indicates that the grain structure of these media ranged from continuous to isolated grains. VSM results show that both S and S* decrease as the grain isolation increases. The media noise of the disk with continuous grains increases linearly with frequency, reaches a maximum, and eventually decreases and has been explained by N.R. Belk et al. (see ibid., vol.MAG-21, no.5, p.1350-5, Sept. 1985). However, the media noise for isolated grain media is weakly dependent on the recording frequency-more like particulate media. The interrelations between microstructure, magnetic, and recording results are discussed.
机译:与薄膜纵向介质相比,颗粒介质显示出较低的介质噪声。薄膜纵向介质中介质噪声的主要来源是之字形转变,这是由于相邻晶粒之间的强磁耦合而产生的。因此,如果可以隔离薄膜纵向介质中的颗粒,则应降低介质噪声。为了改变跨晶界的磁耦合,通过改变Cr底层的微观结构来制备不同微观结构的CoNiCr / Cr膜。 SEM分析表明,这些介质的晶粒结构从连续晶粒到孤立晶粒。 VSM结果表明,随着晶粒隔离度的增加,S和S *均降低。具有连续颗粒的圆盘的介质噪声随频率线性增加,达到最大值,最后减小,这已由N.R.解释。 Belk等。 (参见同上,MAG-21,第5卷,第1350-5页,1985年9月)。但是,隔离的谷物介质的介质噪声几乎不依赖于记录频率,更像颗粒介质。讨论了微观结构,磁性和记录结果之间的相互关系。

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