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Effect of media properties on side erase bands

机译:介质属性对侧面擦除带的影响

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The erase bands on CoNiCr/Cr longitudinal media with coercivities ranging from 176 to 1390 Oe have been studied using a two-frequency, triple-track profile method. In this method, the two side tracks are recorded at 10 kfci and the central track ranges from 0 to 40 kfci. The write and the erase widths are measured by the Bitter method. Media properties such as coercivity, coercivity squareness, and remanence-thickness product are correlated with the total write width. It is shown that media with high coercivity squareness contribute to a reduction in the width of a side erase band. The magnetic structure of the triple-track profile has been characterized by high-resolution Bitter patterns using scanning electron microscopy, showing domain structures within bit cells and along track edges. The relationship of the erase band to the magnetic structure is discussed.
机译:使用二频,三磁道轮廓法研究了矫顽力为176至1390 Oe的CoNiCr / Cr纵向介质上的擦除带。在这种方法中,两个侧轨的记录速度为10 kfci,中央轨的范围为0至40 kfci。写入和擦除宽度通过Bitter方法测量。诸如矫顽力,矫顽力矩形度和剩磁厚度积之类的介质属性与总写入宽度相关。已显示出具有高矫顽力矩形度的介质有助于减小侧擦除带的宽度。三磁道轮廓的磁性结构已通过使用扫描电子显微镜的高分辨率苦味图案进行了表征,显示了位元内和沿磁道边缘的畴结构。讨论了擦除带与磁性结构的关系。

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