The influence of different underlayers on the microstructure and magnetic properties of very thin CoCr films deposited by RF-sputtering on glass computer disks

摘要

Very thin CoCr films deposited on different kinds of underlayers on glass disk substrates were studied in order to understand the origin of underlayer effects. Nearly rectangular perpendicular magnetooptic Kerr effect loops were obtained from CoCr films on Si substrates. Transmission electron microscope electron diffraction studies of Ti(300 AA)/CoCr(160 AA) (which exhibits a rectangular loop) and Cr(300 AA)/CoCr(160 AA) (which exhibits a poorly shaped perpendicular loop) showed that the texture of the CoCr film was dominated by the texture of its underlayer. The epitaxial-growth model applies to these films.