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Magnetic force microscopy study of edge overwrite characteristics in thin film media

机译:磁力显微镜在薄膜介质中边缘覆盖特性的研究

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In this paper, track edge overwrite characteristics in planar isotropic longitudinal thin film media were studied by direct magnetic force microscopy imaging of the edge overwrite patterns. It is found that edge erasure strongly depends on the phase difference between the transitions in the overwriting and overwritten tracks at track edges. If the transitions in the adjacent tracks are in-phase, there exists no edge erase band and transitions in the adjacent tracks area connected in the side written band. Edge erasure occurs when there exist sufficient large phase differences between the transitions in the adjacent tracks. This new understanding of phase dependence of edge overwrite could have strong impact to the system design in terms of consideration for both PES and recording off-track performance.
机译:在本文中,通过直接磁力显微镜成像的边缘覆盖图案研究了平面各向同性纵向薄膜介质中的轨道边缘覆盖特性。发现边缘擦除在很大程度上取决于在轨道边缘处的重写轨道和重写轨道中的过渡之间的相位差。如果相邻轨道中的过渡是同相的,则不存在边缘擦除带,并且在侧写带中连接的相邻轨道区域中将存在过渡。当相邻轨道的过渡之间存在足够大的相位差时,就会发生边缘擦除。在考虑PES和记录偏离轨性能方面,对边沿覆盖的相位相关性的这种新理解可能会对系统设计产生重大影响。

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