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Standardized ESD test for magnetoresistive recording heads

机译:磁阻记录头的标准化ESD测试

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A methodology and apparatus are described for completely characterizing the electrostatic discharge (ESD) sensitivity of magnetoresistive (MR) recording heads. ESD testing of MR heads from six vendors was performed and a "Human Body Model" (HBM) failure voltage as low as 85 V was measured. Air gap breakdown voltages ranging from 400 V to 1100 V were also found. Two new findings were MR sensor damage when ESD pulses were injected into non-MR pins and corona damage. SEM failure analysis after ESD testing showed melting, pitting, and corona damage of the recording head structure. It is concluded that the MR/ESD tester is useful in studying the electrostatic properties of MR recording heads.
机译:描述了用于完全表征磁阻(MR)记录头的静电放电(ESD)灵敏度的方法和设备。对六个供应商的MR磁头进行了ESD测试,并测量了低至85 V的“人体模型”(HBM)故障电压。还发现气隙击穿电压范围为400 V至1100V。两项新发现是将ESD脉冲注入非MR引脚时MR传感器损坏和电晕损坏。 ESD测试后的SEM失效分析表明,记录头结构发生融化,点蚀和电晕损坏。结论是,MR / ESD测试仪可用于研究MR记录头的静电性能。

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