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VIIRS Reflective Solar Band Radiometric and Stability Evaluation Using Deep Convective Clouds

机译:利用深对流云的VIIRS反射太阳波段辐射度和稳定性评估

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This work takes advantage of the stable distribution of deep convective cloud (DCC) reflectance measurements to assess the calibration stability and detector difference in Visible Infrared Imaging Radiometer Suite (VIIRS) reflective bands. VIIRS Sensor Data Records (SDRs) from February 2012 to June 2015 are utilized to analyze the long-term trending, detector difference, and half angle mirror (HAM) side difference. VIIRS has two thermal emissive bands with coverage crossing 11 μm for DCC pixel identification. The comparison of the results of these two processing bands is one of the indicators of analysis reliability. The long-term stability analysis shows downward trends (up to approximately 0.4% per year) for the visible and near-infrared bands and upward trends (up to 0.5% per year) for the shortand midwave infrared bands. The detector difference for each band is calculated as the difference relative to the average reflectance over all detectors. Except for the slightly greater than 1% difference in the two bands at 1610 nm, the detector difference is less than 1% for other solar reflective bands. The detector differences show increasing trends for some short-wave bands with center wavelengths from 400 to 600 nm and remain unchanged for the bands with longer center wavelengths. The HAM side difference is insignificant and stable. Those short-wave bands from 400 to 600 nm also have relatively larger HAM side difference, up to 0.25%. Comparing the striped images from SDR and the smooth images after the correction validates the analyses of detector difference and HAM side difference. These analyses are very helpful for VIIRS calibration improvement and thus enhance product quality.
机译:这项工作利用深对流云(DCC)反射率测量值的稳定分布来评估可见光红外成像辐射计套件(VIIRS)反射带中的校准稳定性和检测器差异。利用2012年2月至2015年6月的VIIRS传感器数据记录(SDR)来分析长期趋势,探测器差异和半角镜(HAM)侧面差异。 VIIRS具有两个热发射带,其覆盖范围超过11μm,用于DCC像素识别。这两个处理频段的结果比较是分析可靠性的指标之一。长期稳定性分析表明,可见光和近红外波段的下降趋势(每年约0.4%),短波和中波红外波段的上升趋势(每年约0.5%)。计算每个频带的检测器差异,作为相对于所有检测器的平均反射率的差异。除了两个波段在1610 nm处的差异略大于1%之外,其他太阳反射频段的探测器差异均小于1%。对于中心波长为400至600 nm的某些短波带,检测器的差异显示出增加的趋势,而对于中心波长较长的波带,检测器的差异保持不变。 HAM方面的差异微不足道且稳定。那些从400到600 nm的短波段也具有相对较大的HAM侧差,最高可达0.25%。将校正后的SDR条纹图像与平滑图像进行比较,可以验证对检测器差异和HAM边差异的分析。这些分析对于VIIRS校准的改进非常有帮助,从而提高了产品质量。

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