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Uncooled InAs-GaSb type-II infrared detectors grown on GaAs substrates for the 8-12-/spl mu/m atmospheric window

机译:在GaAs基板上生长的非冷却InAs-GaSb II型红外探测器,用于8-12- / spl mu / m大气窗口

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摘要

We report on the growth and characterization of type-II infrared detectors with an InAs-GaSb superlattice active layer for the 8-12-/spl mu/m atmospheric window at 300 K. The material was grown by molecular beam epitaxy on semi-insulating GaAs substrates. Photoconductive detectors fabricated from the superlattices showed 80% cutoff at about 12 /spl mu/m at room temperature. The responsivity of the device is about 2 mA/W with a 1-V bias (E=5 V/cm) and the maximum measured detectivity of the device is 1.3/spl times/10/sup 8/ cm.Hz/sup 1/2//W at 11 /spl mu/m at room temperature. The detector shows very weak temperature sensitivity. Also, the extracted effective carrier lifetime, /spl tau/=26 ns, is an order of magnitude longer than the carrier lifetime in HgCdTe with similar bandgap and carrier concentration.
机译:我们报告了在300 K下8-12- / spl mu / m大气窗口中具有InAs-GaSb超晶格活性层的II型红外探测器的生长和特性。该材料是通过分子束外延在半绝缘条件下生长的GaAs衬底。由超晶格制成的光电导检测器在室温下在约12 / spl mu / m处显示80%的截止值。器件的响应度约为2 mA / W,偏置电压为1V(E = 5 V / cm),并且最大测量灵敏度为1.3 / spl乘以10 / sup 8 / cm.Hz / sup 1室温下为/ 2 // W,为11 / spl mu / m。检测器显示出非常弱的温度灵敏度。而且,所提取的有效载流子寿命/ spl tau / = 26 ns,比具有相似带隙和载流子浓度的HgCdTe中的载流子寿命长一个数量级。

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