Mixed signal test-techniques, applications and demands

摘要

Increasing importance of next technology to provide high quality,nlow cost fault detection methodologies is becoming a big issue in thenmicroelectronics industry. For digital ASICs, techniques such asnIddq and built-in-self test are being introduced tonsupplement or in some cases replace stuck-at testing that has been shownnto be inadequate for the circuit complexities and quality levelsndemanded. For analogue and mixed signal ICs, a similar trend is evident.nIncreasing circuit complexity, higher performance and the demand fornhigh quality levels is causing the industry to question currently usednfunctional and specification based test programs. In addition, thenescalating costs of production test equipment capable of measuring highnperformance device parameters is in many cases becoming a limitingnfactor. The authors review the current state-of-the art in mixed signalnand analogue test particular reference to the consumer electronicsnindustry. Trends in key issues such as design-for-test, faultnsimulation, defect detection, CAD and tester support are discussed andnthe possible future role of these techniques is proposed for the nextngeneration of single chip analogue and mixed signal test systems