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Simple petrographic grain size analysis of siltstone reservoir rocks: An example from the Montney tight gas reservoir (Western Canada)

机译:粉砂岩储层岩石的简单岩相粒度分析:以蒙特尼致密气藏为例(加拿大西部)

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This paper presents a simple petrographic approach to measure grain size distributions of fine-grained tight reservoir rocks, simultaneous to other organic petrographic measurements. Application of reflected light microscopy on polished blocks is a routine methodology for organic petrographic analyses including maceral examination and measurement of vitrinite reflectance. While routine petrographic analysis is in progress, the presented method enables operators to provide simultaneous reporting of quantitative grain size distribution by random orientation measurement of grain diameters using a relatively quick and simple procedure. This method provides added value to the routine analytical information provided by organic petrography laboratories. Application of ultra violet (UV) incident light under both oil and water immersion objectives provides a far better visual distinction of grain boundaries compared to white incident light. The improved visual distinction is likely due to differences in the diffused UV energy between surface scattering of the crystalline grains and the subsurface scattering of the incident light from internal irregularities such as grain boundaries and cemented areas in the polycrystalline rock samples. As a result of this optical phenomenon, grain boundaries are highly visible as a light blue UV rim. We suggest a random orientation measurement of 50-250 grain diameters, depending on sample sorting in various parts of a polished block, to give a valid statistical dataset and a valid size distribution histogram. (C) 2015 Elsevier Ltd. All rights reserved.
机译:本文提出了一种简单的岩相学方法,可以与其他有机岩相学测量同时测量细密致密储层岩石的粒度分布。反射光显微镜在抛光块上的应用是有机岩石学分析的常规方法,包括显微检查和镜质体反射率的测量。在进行常规岩相学分析时,提出的方法使操作员可以使用相对快速和简单的过程,通过对晶粒直径进行随机方向测量来提供定量晶粒尺寸分布的同时报告。这种方法为有机岩石学实验室提供的常规分析信息提供了附加价值。与白色入射光相比,在油浸式和水浸式物镜下施加紫外线(UV)入射光可提供更好的视觉识别。改善的视觉分辨力可能是由于晶粒的表面散射与来自内部不规则部分(例如多晶岩样品中的晶界和胶结区域)的入射光的次表面散射之间的紫外线能量差异所致。由于这种光学现象,晶界作为浅蓝色UV边缘高度可见。我们建议对随机直径大小为50-250的晶粒进行定向测量,这取决于抛光块各个部分的样品分类,以提供有效的统计数据集和有效的尺寸分布直方图。 (C)2015 Elsevier Ltd.保留所有权利。

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