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Molecular mapping of powdery mildew resistance genes in wheat: A review

机译:小麦抗白粉病基因的分子图谱研究进展

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Powdery mildew, caused by Blumeria graminis f. sp. tritici (syn. Erysiphe graminis f. sp. tritici), is one of the most important diseases of common wheat (Triticum aestivum L.) worldwide. Molecular mapping and cloning of genes for resistance to powdery mildew in hexaploid wheat will facilitate the study of molecular mechanisms underlying resistance to powdery mildew diseases and help understand the structure and function of powdery mildew resistance genes, and permit marker-assisted selection in breeding programs. So far, 48 genes/alleles for resistance to powdery mildew at 32 loci have been identified and located on 16 different chromosomes, of which 21 resistance genes/alleles have been tagged by restriction fragment length polymorphisms (RFLPs), random-amplified polymorphic DNAs (RAPDs), amplified fragment length polymorphisms (AFLPs), sequence characterized amplified regions (SCARs), sequence-tagged sites (STS) or simple sequence repeats (SSRs). Several quantitative trait loci (QTLs) for adult plant resistance (APR) to powdery mildew have been associated with molecular markers. The detailed information on chromosomal location and molecular mapping of these genes has been reviewed. Isolation of powdery mildew resistance genes and development of valid molecular markers for pyramiding resistance genes in breeding programs is also discussed.
机译:白粉病,由Blumeria graminis f。引起。 sp。小麦(Erysiphe graminis f.sp.tritici)是世界上最常见的普通小麦(Triticum aestivum L.)疾病之一。六倍体小麦抗白粉病基因的分子作图和克隆将有助于研究抗白粉病疾病的分子机制,并有助于了解白粉病抗性基因的结构和功能,并允许在育种计划中进行标记辅助选择。迄今为止,已鉴定出32个位点对白粉病具有抗性的48个基因/等位基因,并位于16个不同的染色体上,其中21个抗性基因/等位基因已通过限制性片段长度多态性(RFLP),随机扩增的多态性DNA进行了标记( RAPD),扩增片段长度多态性(AFLP),序列特征扩增区域(SCAR),序列标记位点(STS)或简单序列重复(SSR)。成年植物对白粉病的抗性(APR)的几个数量性状基因座(QTL)与分子标记有关。审查了有关这些基因的染色体定位和分子作图的详细信息。还讨论了白粉病抗性基因的分离以及在育种程序中金字塔抗性基因的有效分子标记的开发。

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