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首页> 外文期刊>IEE Proceedings. Part H >Exact ray path calculations using realistic ionospheres
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Exact ray path calculations using realistic ionospheres

机译:使用真实电离层的精确射线路径计算

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The paper discusses a technique for fitting quasiparabolic layers to measured vertical electron density profiles. The method adopted is to represent individual ionospheres by the appropriate combination of E, E-F valley, F/sub 1/ and F/sub 2/ layers connected by joining layers. The method produces quite accurate representations of measured ionospheric profiles. The advantage of using quasiparabolic layers is that analytical solutions of various ray parameters can be obtained, including the effect on signal strength of ray tube divergence. Furthermore, tilted ionospheres can also be considered. The methods are illustrated by application to two vertical electron density profiles obtained from the same ionogram. The primary difference in the profiles is that one contains an E-F valley. Results are presented showing not only the effects of the profile differences, but also the effects of tilts, antenna patterns and ionospheric absorption.
机译:本文讨论了一种将准抛物线层拟合到测得的垂直电子密度分布的技术。所采用的方法是通过将E,E-F谷,F / sub 1 /和F / sub 2 /层(通过连接层连接)的适当组合表示单个电离层。该方法可以产生非常精确的电离层剖面图。使用准抛物线层的优点是可以获得各种射线参数的解析解,包括对射线管发散信号强度的影响。此外,也可以考虑倾斜的电离层。该方法通过应用于从同一离子图获得的两个垂直电子密度分布图进行说明。轮廓的主要区别在于其中包含一个E-F谷。给出的结果不仅显示了轮廓差异的影响,还显示了倾斜,天线方向图和电离层吸收的影响。

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