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Parametric indicators for partial shading and fault prediction in photovoltaic arrays with various interconnection topologies

机译:具有各种互连拓扑的光伏阵列中局部遮阳和故障预测的参数指示器

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Photovoltaic arrays are mainly installed to generate maximum power and serve the load demand. However, the arrays are susceptible to various unpredictable scenarios such as partial shading and electrical faults that reduce the overall performance and result in serious power loss, hotspot formation, and severe damage to the modules. So, partial shading and fault detection algorithms are considered to be an important constituent to avoid unwanted power loss and system failures. Most of the algorithms use the voltage and current variation approach as detecting indicators for shading and faults. However, the array voltage and current can also vary due to certain other factors such as module temperature difference that result in reliability reduction due to false detection. In this paper, the sensitivity of various widely used array topologies to partial shading and electrical faults have been studied using various electrical parametric indicators. The variability of these indicators to shading and faults has been studied for determining the most relevant indicators that can be used for shade and faults detection in all array topologies. Also, the topologies have been studied using the characteristics curves, power generation, and mismatch losses to determine the most fault-tolerant topologies. The entire study has been performed in the MATLAB/Simulink environment and validated using experimental analysis. It has been found that the indicators largely varies to the shading/faults in the arrays and differs for different topologies and can be used to detect/predict faults. Also, it has been found that during minimum (10%) and maximum (90%) system shading, the parallel topology generated higher power nearly equal to 88.95% and 19.48% of the unshaded scenario respectively. However, during 90% system fault, all the topologies generated nearly equal power i.e. 11.27% of the no-fault scenario.
机译:光伏阵列主要安装,以产生最大功率并提供负载需求。然而,阵列易受各种不可预测的场景,例如部分着色和电气故障,从而降低整体性能并导致严重的功率损耗,热点形成,以及对模块的严重损坏。因此,部分着色和故障检测算法被认为是避免不需要的功率损耗和系统故障的重要组成部分。大多数算法使用电压和电流变化方法作为遮蔽和故障的检测指示器。然而,阵列电压和电流也可以随着某些其他因素而变化,例如模块温度差,导致由于假检测导致可靠性降低。本文研究了各种电动参数指示器研究了各种广泛使用的阵列拓扑对部分着色和电气故障的敏感性。研究了这些指标对阴影和故障的可变性,用于确定最相关的指标,可用于所有阵列拓扑中的阴影和故障检测。此外,已经使用特征曲线,发电和错配损失研究了拓扑,以确定最容错的拓扑。整个研究已经在Matlab / Simulink环境中进行并使用实验分析验证。已经发现,指标在很大程度上变化到阵列中的阴影/故障,不同的拓扑,并且可用于检测/预测故障。此外,已经发现,在最小(10%)和最大(90%)系统遮阳期间,并行拓扑分别产生的平行拓扑分别产生了较高的功率近于88.95%和19.48%的未体内情景。但是,在90%的系统故障期间,所有拓扑都会产生几乎相等的功率I.E.11.27%的无故障方案。

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