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Improved IIP3 double-pole double-throw switch with body and gate floated multi-stack resonator in 65 nm CMOS for WiGig applications

机译:改进的IIP3双刀双掷开关,具有用于WiGig应用的65 nm CMOS的本体和栅极浮置多堆叠谐振器

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摘要

A 60 GHz improved IIP3 double-pole double-throw (DPDT) switch using body and gate floated multi-stack resonator implemented in 65 nm CMOS technology is presented. To improve the IIP3, multi-stack and resistive body-floating techniques are used. To decrease the insertion loss, the resistive body-floating, gate-floating and resonant inductor techniques are used. This DPDT switch is designed to have effective size using body and gate floated multi-stack resonator. IIP3 is better than 27.5 dBm in 58.8–65.3 GHz. Insertion loss is <3.3 dB in 57–66 GHz. Return loss is better than 10 dB in 49–68 GHz.
机译:提出了一种采用60 nm CMOS技术实现的采用主体和栅极浮置多堆叠谐振器的60 GHz改进型IIP3双刀双掷(DPDT)开关。为了改善IIP3,使用了多堆叠和电阻式浮体技术。为了减少插入损耗,使用了电阻体浮动,栅极浮动和谐振电感器技术。该DPDT开关设计为使用主体和栅极浮动多堆叠谐振器具有有效尺寸。在58.8–65.3 GHz,IIP3优于27.5 dBm。在57–66 GHz中,插入损耗<3.3 dB。在49–68 GHz中,回波损耗优于10 dB。

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