BAST: BIST-Aided Scan Test. A New Method for Test Cost Reduction

摘要

It is common to use ATPG of scan-based design for high fault coverage in LSI testing. However, significant increases in test cost arise with increasing design complexity. Recent strategies for test cost reduction combine ATPG and BIST techniques. Unfortunately, these strategies have serious constraints. We propose a new method that employs ATE and BIST structures to apply coded test patterns to LSI circuits. Results obtained using practical circuits show drastic test cost reduction capability of the proposed method.