Benchtop Test Instruments

摘要

Last month, instrument manu-facturers continued to respond to the industry unquenchable thirst for higher-frequency performance across a wide spectrum of applications.rnAt 4G World 2009 in Chicago, Aeroflex announced new LTE measurement capabilities for its flexible, modular PXI 3000 platform, designed to provide faster time to volume for RF components and LTE user equipment. The LTE FDD measurement suite option let test engineers use low-cost modular PXI equipment to characterize LTE terminals, chipsets, and RF components. LTE terminals will support coexistence of LTE with legacy standards in the same device, key to improve production yield and reduce test times.