Enhanced LogicVision test tool finds 'vectorless' way to transfer data

摘要

San Jose, Calif. ― Expanding the scope of its current icBIST product, LogicVision Inc. is rolling out Embedded Test 4.0 (ET 4.0), which claims a "vectorless" transfer of data between design and test. The product contains icBIST's design-for-test capabilities and adds features aimed at test engineers. Essentially, ET 4.0 combines the current icBIST 3.3 with a new module called IC Debug. The existing icBIST 3.3 product lets chip designers install built-in self-test (BIST) structures for logic, memory and phaselocked loops (PLLs). IC Debug makes generation and translation of test vectors unnecessary and provides an ATE-indepen-dent user interface that permits hierarchical diagnostics.