STRAIN IN MULTILAYERED SYSTEMS AND ITS INFLUENCE ON ASYMMETRIC X-RAY DIFFRACTION PROFILES

摘要

The paper presents the results of the validity test of the sin~2Ψ method applied for determining strains in a case of multilayer systems. The calculations were performed using three-dimensional model based on a Monte Carlo simulation and the kinematical theory of scattering. Our calculations show that the analysis of strains in multilayers Performed using the sin~2Ψ method may give misleading results and therefore should be accompanied by other methods.