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首页> 外文期刊>IEEE Transactions on Electromagnetic Compatibility >Modal Analysis for a Bounded-Wave BMP Simulator - Part II: Radiation Leakage and Mode Suppression
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Modal Analysis for a Bounded-Wave BMP Simulator - Part II: Radiation Leakage and Mode Suppression

机译:界波BMP模拟器的模态分析-第二部分:辐射泄漏和模式抑制

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摘要

Radiation leakage from a high-power bounded-wave electromagnetic pulse simulator can cause severe electromagnetic interference (EMI) with surrounding equipment. In Part I, we analyzed the electromagnetic mode structure inside a simulator. In Part II, we examine the relative contribution of these modes to radiation leakage. We have calculated the temporal cross correlation between the electromagnetic modes inside the simulator and the temporal waveform of the forward-radiated far field. The TM1 and TM2 modes show strong cross correlation over a range of switching times. For the TEM mode, on the other hand, this holds true only for larger values of the switching time. Hence, for a given mode amplitude, higher order TM modes tend to produce more leakage than the TEM mode. However, since TEM is far stronger than TM throughout the simulator, it may still contribute more in absolute terms. Increasing the angle between simulator plates excites more higher order modes and increases their strength, thereby enhancing leakage. Pulse compression with respect to time increases the relative strength of higher order modes. Placing a spatial mode filter inside the simulator significantly reduces TM{sub}1 without modifying the desired TEM mode. However, TM{sub}2 remains largely unchanged. The reduction in TM{sub}1 depends sensitively upon the parameters of the filter. These observations illustrate a new method of understanding and improving simulator design from the point of view of EMI.
机译:大功率有界波电磁脉冲模拟器的辐射泄漏会导致对周围设备的严重电磁干扰(EMI)。在第一部分中,我们分析了模拟器内部的电磁模式结构。在第二部分中,我们研究了这些模式对辐射泄漏的相对影响。我们已经计算出模拟器内部的电磁模式与正向辐射远场的时间波形之间的时间互相关。 TM1和TM2模式在一定的开关时间内显示出很强的互相关性。另一方面,对于TEM模式,这仅适用于较大的切换时间值。因此,对于给定的模式振幅,高阶TM模式倾向于比TEM模式产生更多的泄漏。但是,由于在整个仿真器中TEM都比TM强大得多,因此从绝对角度来说,TEM仍可能贡献更多。增加仿真器板之间的角度会激发更多高阶模,并增加其强度,从而增强泄漏。关于时间的脉冲压缩增加了高阶模的相对强度。在模拟器内放置空间模式滤波器会显着降低TM {sub} 1,而无需修改所需的TEM模式。但是,TM {sub} 2基本上保持不变。 TM {sub} 1的减少敏感地取决于滤波器的参数。这些观察结果说明了从EMI角度理解和改进模拟器设计的新方法。

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