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EMI/EMC Measurements and Simulations for Cables and PCBs Enclosed Within Metallic Structures

机译:封闭在金属结构中的电缆和PCB的EMI / EMC测量和模拟

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This paper presents a series of measurements to study various electromagnetic compatibility (EMC)/electromagnetic interference (EMI) coupling scenarios, frequently encountered in electronic systems. Specifically, field penetration through apertures and coupling of penetrating wires onto the printed circuit boards (PCBs) enclosed by resonant structures are considered. In contrast to other measurements, we focus on multi-cavity enclosures in the presence of cables and PCBs. The purpose of this experimental study is to provide accurate reference data for possible future validation of various computational tools and to test their accuracy and efficiency on realistic platforms. In particular, we validate a recently proposed hybrid scheme based on S-parameters for concurrent EMI/EMC analysis of large structures with enclosed linearonlinear circuit devices in active operating mode.
机译:本文提出了一系列测量方法,以研究电子系统中经常遇到的各种电磁兼容性(EMC)/电磁干扰(EMI)耦合场景。具体地,考虑了穿过孔的场穿透以及将穿透线耦合到由谐振结构包围的印刷电路板(PCB)上。与其他测量相反,我们将重点放在存在电缆和PCB的多腔外壳上。这项实验研究的目的是为将来各种计算工具的验证提供准确的参考数据,并在实际平台上测试其准确性和效率。特别是,我们验证了最近提出的基于S参数的混合方案,该方案可在有源工作模式下对带有封闭线性/非线性电路器件的大型结构进行同时EMI / EMC分析。

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