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首页> 外文期刊>IEEE Transactions on Electromagnetic Compatibility >Advanced Analysis of Faults Injected Through Conducted Intentional Electromagnetic Interferences
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Advanced Analysis of Faults Injected Through Conducted Intentional Electromagnetic Interferences

机译:通过传导的故意电磁干扰注入的故障的高级分析

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摘要

Experimental setups used in electromagnetic compatibility (EMC) tests can be used as platforms for fault injections. Injecting faults into equipment is a means for a malevolent attacker to extract secret information. In this paper, we first present an advanced setup, i.e., a setup with characteristics beyond the main international EMC standards. It performs more accurate measurements of the disturbance power, reducing the measurement error by 20.33?dB. Second, we propose an advanced analysis methodology allowing an attacker or a countermeasure designer to identify the disturbance frequency leading to the most powerful attack. As an illustration, the method is applied on an ASIC implementation of DES, providing a thorough characterization and classification of the generated faults. In this case, the most powerful attacks are performed when the disturbance has a frequency below 1?MHz. The threat has thus to be considered really serious, as generating such disturbance does not require a high budget.
机译:电磁兼容性(EMC)测试中使用的实验设置可用作故障注入的平台。向设备注入故障是恶意攻击者提取秘密信息的一种手段。在本文中,我们首先介绍一种高级设置,即具有超出主要国际EMC标准的特性的设置。它可以对干扰功率进行更精确的测量,从而将测量误差降低了20.33?dB。其次,我们提出一种高级分析方法,使攻击者或对策设计者可以识别导致最强大攻击的干扰频率。作为说明,该方法应用于DES的ASIC实现,可对生成的故障进行全面的表征和分类。在这种情况下,当干扰的频率低于1?MHz时,将执行最强大的攻击。因此,必须将威胁视为非常严重,因为产生此类干扰并不需要很高的预算。

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