CISPR 16-4-2 Equivalent Measurement Uncertainty Analysis for TEM Waveguides

摘要

The result of any measurement will only be of significance if the uncertainty of the measurement method can be specified concerning its influence quantities. In the case of CISPR compliant-radiated disturbance measurements, the result of the measurement is usually compared to a given limit line. For established test methods (ETM), this comparison can be done directly if the expanded measurement uncertainty falls below a value stated for a typical test facility by the standard. In this paper, the definitions and the classification the CISPR describes for ETM are applied to transverse electromagnetic (TEM) waveguide measurements. It is shown that the overall uncertainty of a typical TEM waveguide is slightly lower than that of a typical ETM.