Efficient Circuit Modeling Technique for the Analysis and Optimization of ISO 10605 Field Coupled Electrostatic Discharge (ESD) Robustness of Nonlinear Devices

摘要

In this paper, we propose a circuit modeling technique for the ISO 10605 field-coupled electrostatic discharge (ESD) test, often used in the automotive sector. First, a novel circuit model of the ESD gun is proposed. Second, a circuit model is developed for the ISO 10605 field-coupled ESD test bench and concatenated with models for the load box and the device under test (DUT). To validate the advocated models, a nonlinear DUT is simulated, manufactured, and measured under the ISO 10605 field-coupled ESD test conditions. Furthermore, it is shown that the circuit model can be used to efficiently optimize the design of the DUT, making it more robust against ESD disturbances. The optimized DUT design was again manufactured and measured, validating the simulated results.