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Thermal modeling heats up for the MAINSTREAM

机译:MAINSTREAM的热模型升温

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Getting The Heat out of systems is one of the oldest challenges of electronics design. It's also the aspect that potentially affects reliability the most: Conventional wisdom suggests that every 10℃ increase in junction temperature approximately doubles a semiconductor device's failure rate. The devices that require thermal attention are no longer limited to power supplies; discrete components, drivers, processors, and even random logic functions now come in packaging densities that force system-level consideration. This trend is proliferating, with many vendors introducing proprietary packages, typically variations on surface-mount designs for power semiconductors. Recent examples include International Rectifier's DirectFET devices; National Semiconductor's LLP (leadless low-profile) chip-scale and micro-SMD packages; and the LFPak (loss-free package) from Philips. Seemingly, the drive for ever-lower on-resistance in power FETs has reached a plateau, and the new amps-per-square-inch constraint is package dissipation.
机译:消除系统热量​​是电子设计最古老的挑战之一。这也是可能对可靠性产生最大影响的一个方面:传统观点认为,结温每升高10℃,半导体器件的故障率大约增加一倍。需要散热的设备不再局限于电源;分立组件,驱动器,处理器,甚至随机逻辑功能现在都具有封装密度,这迫使系统级的考虑。随着许多厂商推出专有封装,这种趋势正在激增,通常是功率半导体表面贴装设计的变体。最近的例子包括国际整流器公司的DirectFET器件。美国国家半导体的LLP(无引线低剖面)芯片级封装和微型SMD封装;以及飞利浦的LFPak(无损包装)。看来,功率FET的导通电阻越来越低的驱动器已经达到平稳状态,而每平方英寸的新安培约束是封装耗散。

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