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SWITCHING OPTIONS: THE RIGHT FIT MIGHT COME WITH A LOSS

机译:切换选项:正确的选择可能会导致损失

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摘要

Whether you are building "big-iron" RF-test equipment or tiny, multiband mobile devices, you need to route RF and microwave signals among instruments and devices under test or between antennas and amplifiers. To accomplish that task, you can turn to various solid-state implementations, including SOI (silicon-on-insulator) devices andrnMEMS (microelectromechanical-system) switches, both of which vendors were touting at the June IEEE MTT-S (Microwave Theory and Techniques) International Microwave Symposium. Highly integrated bulk-CMOS devices represent another alternative. However,rnyou need to know when those options make sense as alternatives to the more traditional electromechanical, PIN-di-ode, and GaAs (gallium-arsenide) FET versions. Solid-state and MEMS switch-es take up much less real estate and have longer lifetimes than do electromagnetic switches. Further, SOI and MEMS devic-es can be easier to integrate than GaAs devices with other components. Before embarking on switch selection, however, you need to understand whether the specs of the device you select will meet your application requirements.
机译:无论是制造“大型” RF测试设备还是小型多频带移动设备,都需要在被测仪器和设备之间或天线与放大器之间路由RF和微波信号。要完成该任务,您可以使用各种固态实现,包括SOI(绝缘体上硅)设备和rnMEMS(微机电系统)开关,这两个供应商都在6月的IEEE MTT-S(微波理论和技术)国际微波研讨会。高度集成的体CMOS器件代表了另一种选择。但是,您需要知道这些选项何时可以替代传统的机电,PIN二极管和GaAs(砷化镓)FET版本。与电磁开关相比,固态和MEMS开关占用的空间少得多,使用寿命也更长。此外,SOI和MEMS器件比带有其他组件的GaAs器件更易于集成。但是,在开始选择开关之前,您需要了解所选设备的规格是否满足您的应用要求。

著录项

  • 来源
    《Electrical Design News》 |2009年第18期|30-36|共7页
  • 作者

    RICK NELSON;

  • 作者单位
  • 收录信息 美国《科学引文索引》(SCI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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