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首页> 外文期刊>Electric Power Applications, IET >Discrete fault-clearing instant influence on the simulation of voltage-source-inverter-fed adjustable-speed drives subjected to voltage sags
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Discrete fault-clearing instant influence on the simulation of voltage-source-inverter-fed adjustable-speed drives subjected to voltage sags

机译:离散故障清除即时影响承受电压骤降的电压源-变频器馈电调速驱动器的仿真

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摘要

This study analyses the influence of modelling sags with discrete fault-clearing instants on the behaviour of adjustablespeed drives (ASDs) subjected to sags caused by faults. The effects are compared with those of sags modelled with simultaneous fault clearance in all faulted phases (i.e. abrupt fault clearance; the most common approach to voltage sag modelling). In many cases, abrupt fault clearance is far more severe than discrete fault clearance. Thus, if an ASD rides through a more severe case of an abrupt fault clearance test, it will likely ride through a discrete fault clearance sag. As current protocols for testing the immunity of ASDs to voltage sags only consider abrupt fault clearance, it is not necessary to consider the more complicated discrete fault clearance in equipment sag-testing methodology if more severe abrupt clearance sags are properly chosen and tested.
机译:这项研究分析了具有离散故障清除瞬间的跌落建模对受故障引起跌落的可调速驱动器(ASD)行为的影响。将其影响与在所有故障相中同时进行故障清除建模的下陷的影响进行比较(即突然的故障清除;电压暂降建模的最常用方法)。在许多情况下,突然的故障清除远比离散的故障清除严重得多。因此,如果ASD经历了更为严重的突然故障清除测试,那么它很可能会经历离散的故障清除下陷。由于当前用于测试ASD对电压骤降的抗扰度的协议仅考虑了突然的故障清除,因此,如果适当地选择并测试了更严重的突然清除骤降,则无需在设备的骤降测试方法中考虑更复杂的离散故障清除。

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