...
首页> 外文期刊>EDN Asia >Noncontact device tests power supplies
【24h】

Noncontact device tests power supplies

机译:非接触式设备测试电源

获取原文
获取原文并翻译 | 示例
           

摘要

The probelike device in Figure 1 comes in handy as a quick go-no-go test for step-down power supplies. You can build it using a very bright surface-mount LED and an inductor of the same type as in the power supply, which in this case is 100 |xH. Placing this probe close to a working step-down power-supply coil lights the LED. The probe lights when the distance from the step-down coil is as much as 1 cm, making the probe capable of testing even plastic-encased or epoxy-filled power supplies. Industrial engineers will partic- ularly appreciate the capability of not touching the circuit, which is also a useful feature when testing boards that operate without insulation from the mains.
机译:图1中的类似探针的设备可作为降压电源的快速通过测试。您可以使用非常明亮的表面安装LED和与电源中相同类型的电感器(在这种情况下为100 | xH)来构建它。将此探头放置在工作的降压电源线圈附近,可使LED点亮。当距降压线圈的距离最大为1 cm时,该探针将点亮,从而使该探针甚至可以测试塑料外壳或环氧树脂填充的电源。工业工程师将特别欣赏不接触电路的能力,这在测试没有与主电源绝缘的电路板上时也是有用的功能。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号