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Attenuation bias when measuring inventive performance

机译:衡量发明绩效时的衰减偏差

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摘要

Most previous results on determinants of inventive performance are biased because inventive performance is measured with error. This measurement error causes attenuation bias. More specifically, for example age and education as drivers of patenting success have biased coefficients and too high standard errors when inventive performance is measured in short observation periods. The reason for measurement errors in inventive performance is that patents are typically applied for in waves.
机译:由于发明性能的测量是有误差的,因此大多数先前关于发明性能的决定因素的结果都是有偏差的。该测量误差导致衰减偏差。更具体地说,例如,当在较短的观察周期内测量发明性能时,作为取得专利成功的驱动因素的年龄和教育程度具有偏差的系数和过高的标准误。发明性能中的测量误差的原因是专利通常以波浪形式申请。

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