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首页> 外文期刊>Dielectrics and Electrical Insulation, IEEE Transactions on >Charge accumulation effects on time transition of partial discharge activity at GIS spacer defects
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Charge accumulation effects on time transition of partial discharge activity at GIS spacer defects

机译:电荷积累对GIS隔套缺陷处局部放电活动时间转变的影响

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摘要

The partial discharge (PD) measurements are considered as the most important tool for condition monitoring of Gas Insulated Switchgears (GISs). However, if spacer surface is involved in PD activity, charge accumulation process greatly affects the time transition of PD characteristics. This paper investigates this effect considering the defect types of delamination at the electrode/spacer interface and metallic particles adhered to the spacer surface as the most serious defects that can lead to major failure. Two different electrode configurations were built to simulate the two defect types. The PD characteristics were measured and analyzed from immediately after voltage application up to several minutes where steady state characteristics have been obtained. As a result, it was found that the generation rate of PD pulses changed considerably with time for both defect types. This tendency of PD characteristics has been discussed considering the effect of charge accumulation. Comparing these effects for negative and positive PD enabled to clarify the similarities and differences in the charge accumulation effect for both defect types which can contribute to the defect type identification in GIS. It was found that the effects of charge accumulation on the electric field strength for the delamination defect case as well as on the ionization volume for the metallic particle case were the responsible parameters for the different PD tendencies.
机译:局部放电(PD)测量被认为是气体绝缘开关设备(GIS)状态监测的最重要工具。但是,如果间隔物表面参与PD活性,电荷积累过程会极大地影响PD特性的时间转变。本文考虑到电极/垫片界面处的分层缺陷类型以及粘附在垫片表面的金属颗粒是最严重的缺陷,可能导致重大故障,研究了这种影响。建立了两种不同的电极配置来模拟两种缺陷类型。从施加电压后直至达到稳定状态的几分钟,对PD特性进行测量和分析。结果,发现对于两种缺陷类型,PD脉冲的产生率均随时间而显着变化。已经考虑了电荷积累的影响,讨论了PD特性的这种趋势。比较负和正PD的这些效应可以阐明两种缺陷类型在电荷累积效应上的相似性和差异,这可以有助于GIS中的缺陷类型识别。已发现,电荷积累对分层缺陷情况下的电场强度以及金属颗粒情况下的电离体积的影响是不同PD趋势的主要参数。

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