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首页> 外文期刊>Dielectrics and Electrical Insulation, IEEE Transactions on >Analysis of a fractured 500 kV composite insulator - identification of aging mechanisms and their causes
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Analysis of a fractured 500 kV composite insulator - identification of aging mechanisms and their causes

机译:500 kV复合绝缘子断裂的分析-老化机理及其原因的识别。

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摘要

In this paper, a fractured 500 kV ac composite insulator, whose fracture characteristics differ significantly from those of brittle fracture, is analyzed in order to identify the aging mechanisms involved and their causes. Several sheath punctures occurred along the insulator which apparently originated from inside the insulator. Removal of the sheath revealed weak adhesion as well as tracking along the sheath-core interface. Weak microscopic as well as macroscopic interfaces were indicated by the insulator??s weak performance in the water diffusion and dye penetration test according to IEC 62217. The core material was analyzed by means of FTIR identifying glass corrosion, ion exchange and hydrolysis as major degradation mechanisms. Based on the results of analysis, a water induced aging process is proposed and recommendations for online monitoring of composite insulators with respect to interfacial aging are given.
机译:本文分析了一个断裂的500 kV交流复合绝缘子,其断裂特性与脆性断裂有显着不同,以找出所涉及的老化机理及其原因。沿绝缘子发生了几次护套刺穿,显然是从绝缘子内部产生的。鞘的去除显示出弱的粘附力以及沿着鞘-芯界面的追踪。绝缘体在根据IEC 62217进行的水扩散和染料渗透测试中的性能较弱,表明微观和宏观界面均较弱。通过FTIR分析了芯材,确定玻璃腐蚀,离子交换和水解为主要降解机制。根据分析结果,提出了水致老化过程,并提出了在线监测复合绝缘子界面老化的建议。

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