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机译:利用漏电流和闪络电压分析评估硅橡胶绝缘子的老化
Dept. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran;
ageing; corona; fast Fourier transforms; flashover; hydrophobicity; lamps; leakage currents; moisture; scanning electron microscopes; silicone rubber insulators; thermal analysis; ultraviolet radiation effects; IEC 60507; LC waveforms; TGA; UV exposure; UV-C lamps; aging evaluation; artificial UV radiation effects; artificial pollution deposition; continuous arc; dry band arcing-corona discharge; electric stress; fast Fourier transform; flashover voltage analysis; frequency spectrum; harmonic components; hydrophobicity; incremental discharge; insulator surface; leakage current; moist environment; polluted insulators; scanning electron microscope images; silicone rubber insulators; solid layer method; thermogravimetric analysis; ultraviolet radiation; voltage 20 kV; Aging; Harmonic analysis; Insulators; Pollution measurement; Surface contamination; Surface discharges; Surface impedance;
机译:动态跌落试验中漏电流的回归图分析,用于评估硅橡胶绝缘子的疏水性
机译:利用击穿电压和漏电流评估绝缘子的性能
机译:交流电压下不连续污染绝缘子泄漏电流和闪络电压的预测动力学模型:实验验证
机译:热老化过程中闪络电压与硅橡胶绝缘子的交流电和交流电之间的相关性
机译:直流电压激励的绝缘子污染闪络的动态电弧建模。
机译:施加直流电压的动态跌落测试过程中硅橡胶表面疏水性损失的特性
机译:基于瓷绝缘子漏电流的污染闪络电压预测理论分析