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Aging evaluation of silicone rubber insulators using leakage current and flashover voltage analysis

机译:利用漏电流和闪络电压分析评估硅橡胶绝缘子的老化

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Ultraviolet (UV) radiation decreases the hydrophobicity of silicone rubber (SiR) insulators. Lack of hydrophobicity on the surface of such insulators lowers the flashover voltage and increases the Leakage Current (LC) of insulators in the moist environment. This paper presents the artificial UV radiation effects on three types of 20 kV SiR insulators in a chamber with nine UV-C lamps (50 W/m2) for up to 5000 hours. To simulate the moist environment, solid layer method is applied according to IEC 60507 that includes artificial pollution deposition on the insulator surface. Fast Fourier transform of the LC waveforms indicates that the third and the fifth harmonic components are quite sensitive to any incremental discharge on the insulator surface. This sensitivity makes the frequency spectrum of the LC a good criterion to distinguish three distinct SiR insulator situations under the electric stress: 1) no discharge, 2) dry band arcing/corona discharge and 3) continuous arc. Thermogravimetric analysis (TGA) and scanning electron microscope images depict that the polluted insulators include much larger degraded parts under electric stress after aging. Measurements also show that the flashover voltages and the hydrophobicity of aged insulators decrease as the UV exposure time increases for different levels of moisture and pollution.
机译:紫外线(UV)会降低硅橡胶(SiR)绝缘子的疏水性。在潮湿环境中,此类绝缘子表面缺乏疏水性会降低闪络电压并增加绝缘子的漏电流(LC)。本文介绍了在具有九个UV-C灯(50 W / m 2 )的室内,三种类型的20 kV SiR绝缘子的人造UV辐射效果,可长达5000小时。为了模拟潮湿环境,根据IEC 60507应用了固体层方法,该方法包括在绝缘子表面上进行人工污染沉积。 LC波形的快速傅立叶变换表明,三次谐波分量和第五次谐波分量对绝缘子表面上的任何增量放电非常敏感。这种灵敏度使LC的频谱成为区分电应力下三种不同的SiR绝缘子情况的良好标准:1)无放电,2)干带电弧/电晕放电和3)连续电弧。热重分析(TGA)和扫描电子显微镜图像显示,受污染的绝缘子在老化后的电应力作用下会包含更大的降解部分。测量结果还表明,随着不同湿度和污染水平下紫外线暴露时间的增加,老化绝缘子的闪络电压和疏水性会降低。

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