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Mapping the microstructure evolution of nickel deformed by orthogonal cutting

机译:通过正交切割映射镍的微观结构演变

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Severe plastic deformation prompted by orthogonal cutting is used to create deformed microstructures in commercially pure nickel machined under multiple cutting conditions. The resulting thermomechanical conditions, strain, strain rate, and temperature rise are calculated resulting in the final microstructure of the chip. The microstructure response is quantified for the generated defect during deformation, i.e. dislocation densities besides the microhardness. The dislocation density is measured using the X-ray diffraction peak broadening implementing the Williamson–Hall, and Williamson–Smallman methods. The microstructural consequences are examined through creating the rate-strain-microstructure (RSM) mappings using the Zener-Hollomon (Z) parameter. A 2D visualization of the microstructure response is acquired, and the effects of the strain and Ln(Z) on the measured dislocation densities and microhardness are discussed. The microstructural consequences are validated with the microstructure results reported in the literature over a wide range of Ln(Z) involving temperatures in the range from room temperature to 1420K.
机译:正交切割提示的严重塑性变形用于在多种切割条件下在商业上纯镍中产生变形的微结构。得到的热机械条件,应变,应变率和温度升高,从而导致芯片的最终微观结构。在变形期间产生微观结构响应以产生产生的缺陷,即除了微硬度之外的位错密度。使用实施威廉姆森 - 大厅的X射线衍射峰值展大和威廉姆森 - 小马方法测量位错密度。通过使用ZENER-HOLLOMON(Z)参数产生速率 - 应变微结构(RSM)映射来检查微结构后果。获取微结构响应的2D可视化,讨论了应变和LN(Z)对测量的位错密度和微硬度的影响。通过在涉及室温范围内的范围内的温度至1420K的范围内的宽范围的LN(Z)中,微观结构后果验证了验证的微观结构结果。

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