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首页> 外文期刊>BMC Oral Health >Assessment of implant surface and instrument insert changes due to instrumentation with different tips for ultrasonic-driven debridement
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Assessment of implant surface and instrument insert changes due to instrumentation with different tips for ultrasonic-driven debridement

机译:由于超声波驱动的清创仪器的仪器,植入物表面和仪器插入的评估变化

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摘要

To assess the changes of implant surfaces of different roughness after instrumentation with ultrasonic-driven scaler tips of different materials. Experiments were performed on two moderately rough surfaces (I—Inicell? and II—SLA?), one surface without pre-treatment (III) and one smooth machined surface (IV). Scaler tips made of steel (A), PEEK (B), titanium (C), carbon (D) and resin (E) were used for instrumentation with a standardized pressure of 100?g for ten seconds and under continuous automatic motion. Each combination of scaler tip and implant surface was performed three times on 8 titanium discs. After instrumentation roughness was assessed by profilometry, morphological changes were assessed by scanning electron microscopy, and element distribution on the utmost surface by energy dispersive X-ray spectroscopy. The surface roughness of discs I and II were significantly reduced by instrumentation with all tips except E. For disc III and IV roughness was enhanced by tip A and C and, only for IV, by tip D. Instrumentation with tips B, D and E left extensive residuals on surface I, II and III. The element analysis of these deposits proved consistent with the elemental composition of the respective tip materials. All ultrasonic instruments led to microscopic alterations of all types of implants surfaces assessed in the present study. The least change of implant surfaces might result from resin or carbon tips on machined surfaces.
机译:用不同材料的超声波驱动的缩放尖端评估仪表后不同粗糙度的植入表面的变化。在两个中等粗糙表面(I-Inicell?和II-SLA)上进行实验,一张表面而无需预处理(III)和一个平滑的加工表面(IV)。用钢(A),PEEK(B),钛(C),碳(D)和树脂(E)制成的缩放器尖端用于仪器,其标准化压力为100μg,在连续自动运动下。缩放器尖端和植入物表面的每个组合在8次钛盘上进行三次。通过探测粗糙度通过轮廓测量评估,通过扫描电子显微镜评估形态变化,通过能量分散X射线光谱通过最大表面上的元素分布。通过除E的所有提示外,光盘I和II的表面粗糙度显着减少。对于尖端A和C,尖端A和C的粗糙度和IV粗糙度,并且仅针对IV,通过提示B,D和E的仪器提高IV粗糙度。表面I,II和III的留下广泛的残留物。这些沉积物的元素分析与各个尖端材料的元素组成一致。所有超声仪器导致了本研究中评估所有类型的植入物表面的显微变化。植入物表面的最小变化可能是由机加工表面上的树脂或碳尖端产生的。

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