...
首页> 外文期刊>E3S Web of Conferences >A non-metallic additive for diamond-wire-sawn multi-crystalline silicon texturing
【24h】

A non-metallic additive for diamond-wire-sawn multi-crystalline silicon texturing

机译:钻石线锯多晶硅纹理的非金属添加剂

获取原文

摘要

Diamond-wire-sawn (DWS) technology has been widely used in the photovoltaic industry. When using the HF/HNO_(3)/H_(2)O acid etching solution for texturing of DWS multi-crystalline silicon(mc-Si), the aid of additive is required to improve the reactivity of the mc-Si surface in the acid texturing solution. It also needs to enhance the nucleation and uniform growth of the texturing surface. This paper proposes a non-metallic additive for DWS mc-Si texturing. Sodium polyacrylate is added to the HF/HNO_(3)/H_(2)O acid etching solution to reduce the reflectance of DWS mc-Si and improve surface morphology. Compared to the textured wafers without additive, the surface of the wafers using this method is uniformly distributed with pits whose size is 0.5 μm×1 μm. And the weighted average reflectance of the textured wafers can be reduced from 33.32% to 23.9% in the wavelength range of 350–1100 nm, with the lowest reflectance of 19.8% reached at 950 nm. It shows a promising application prospect.
机译:钻石线锯(DWS)技术已广泛应用于光伏产业。当使用HF / HNO_(3)/ H_(2)O酸蚀刻解决方案进行DWS多晶硅(MC-SI)的纹理时,需要辅助添加剂来改善MC-SI表面的反应性酸纹理解决方案。它还需要增强纹理表面的成核和均匀生长。本文提出了一种非金属添加剂,用于DWS MC-SI纹理。将聚丙烯酸钠加入到HF / HNO_(3)/ h×(2)O酸蚀刻溶液中,以减少DWS MC-Si的反射率并改善表面形态。与没有添加剂的纹理晶片相比,使用该方法的晶片表面均匀地分布,其尺寸为0.5μm×1μm。并且纹理化晶片的加权平均反射率可以在350-1100nm的波长范围内从33.32%降至23.9%,最低反射率为19.8%达到950nm。它显示了一个有希望的应用前景。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号