Digital images captured from CMOS/CCD image sensors are prone to noise due to inherent electronic fluctuations and low photon count. To efficiently reduce the noise in the image, a novel image denoising strategy is proposed, which exploits both nonlocal self-similarity and local shape adaptation. With wavelet thresholding, the residual image in method noise, derived from the initial estimate using nonlocal means (NLM), is exploited further. By incorporating the role of both the initial estimate and the residual image, spatially adaptive patch shapes are defined, and new weights are calculated, which thus results in better denoising performance for NLM. Experimental results demonstrate that our proposed method significantly outperforms original NLM and achieves competitive denoising performance compared with state-of-the-art denoising methods.
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