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首页> 外文期刊>Bulletin of materials science >Photo-induced hydrogenation and rapid cooling measure on dislocation clusters of multi-crystalline silicon PERC solar cells
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Photo-induced hydrogenation and rapid cooling measure on dislocation clusters of multi-crystalline silicon PERC solar cells

机译:多晶硅PERC太阳能电池脱位簇的光致氢化和快速冷却测量

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The dislocations are the deep level defects with a negative impact on the multi-crystalline silicon (mc-Si) solar cells. Though potential mechanisms of dislocation formation on the silicon ingot have been studied, few investigations consider the effect of LED hydrogenation on dislocation clusters. In this study, we have explored the influence of hydrogenation on the dislocation clusters of large-area ($244.34 pm 0.05$ cm$^2$) mc-Si solar cells using the high-intensity infrared LED source. However, applying normal cooling measure to hydrogenation will trigger the instability of thehydrogenation improvement effect due to residual thermal stress, so we proposed an appropriate rapid cooling measure (RCM) followed by hydrogenation and achieved optimized results. The results indicated that electrical properties, minority carrier lifetime, current density, power density and external quantum efficiency were enhanced through LED hydrogenation and RCM, and the degradation of mc-Si solar cells also was significantly suppressed. To estimate the content of dislocations after LED hydrogenation and RCM, we applied the X-ray diffraction techniques to calculate the dislocation density using the full-width at half maximum of the rocking curve at (111), (220), (311), (400) and (331) reflections. The dislocation density of mc-Si PERC solar cells was decreased by $0.12 imes 10^8$ cm$^{-2}$ ($pm 0.02 imes 10^8$ cm$^{-2}$) after LED hydrogenation and RCM. Meanwhile, photoluminescence images also illustrated that LED hydrogenation passivated dislocation clusters as well as impurities and defects gathered by dislocations. Therefore, LED hydrogenation of dislocation clusters is an effective measure to improve the performance of dislocation-containing mc-Si solar cells.
机译:脱臼是对多晶硅(MC-Si)太阳能电池产生负面影响的深度水平缺陷。虽然已经研究了硅锭脱位形成的潜在机制,但很少的调查考虑LED氢化对位错簇的影响。在这项研究中,我们探讨了使用高强度红外LED源的大面积大面积(244.34毫安^ 2 $)MC-SI太阳能电池位错簇的影响。然而,将正常冷却测量施加到氢化将引发由于残留的热应激引起的氢化改善效果的不稳定性,因此我们提出了适当的快速冷却测量(RCM),然后氢化并达到了优化的结果。结果表明,通过LED氢化和RCM提高了电性能,少数型载体寿命,电流密度,电力密度和外量子效率,并且显着抑制了MC-Si太阳能电池的降解。为了估算LED氢化和RCM之后的位错的含量,我们施加了X射线衍射技术以计算(111)的摇摆曲线的半最大值的全宽度计算位错密度,(220),(311), (400)和(331)思考。 { - 2} $($ 下午0.02 乘以10 ^ 8 $厘米$ ^ { - 2} $)后LED MC-硅PERC太阳能电池的位错密度为10 ^ 8 $厘米$ ^下降了$ 0.12 倍氢化和RCM。同时,光致发光图像还示出了LED氢化钝化的位错簇以及脱位收集的杂质和缺陷。因此,位错簇的LED氢化是改善含有脱位的MC-Si太阳能电池性能的有效措施。

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