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首页> 外文期刊>Transactions on Electrical and Electronic Materials >Effect of Conductor Radius of Polyesterimide- Polyamideimide Enameled Round Wire on Insulation Breakdown Voltage and Insulation Lifetime
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Effect of Conductor Radius of Polyesterimide- Polyamideimide Enameled Round Wire on Insulation Breakdown Voltage and Insulation Lifetime

机译:聚酯酰亚胺聚酰胺聚酰胺酰胺型圆线对导体半径对绝缘击穿电压和绝缘寿命的影响

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Insulation breakdown voltage and insulation lifetime were investigated in straight lines or twisted pairs with polyesterimide-polyamideimide enameled round wires (EI/AIW ). The enamel thickness was 50 μm and the conducting copper radius was 0.50, 0.75, 1.09, and 1.50 mm, respectively. There were many air gaps in a twisted pair therefore, when voltage was applied to the twisted pair, enamel erosion took place in the air gap area because of partial discharge according to Paschen's law. Insulation breakdown voltage and insulation lifetime were highest in the sample of 0.75 mm conductor radius, which was higher than those values for 0.50 mm or 1.09 and 1.55 mm.
机译:在直线或带有聚酯酰亚胺 - 聚酰胺酰亚胺搪瓷圆线(EI / AIW)的双绞线上研究了绝缘击穿电压和绝缘寿命。搪瓷厚度为50μm,传导铜半径分别为0.50,0.75,1.09和1.50mm。因此,当施加到双绞线时,当将电压施加到双绞线时,由于根据Paschen的定律,当电压施加到双绞线时,搪瓷侵蚀在气隙区域中发生。绝缘击穿电压和绝缘寿命在0.75mm导体半径的样品中最高,高于0.50mm或1.09和1.55mm的值。

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