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In-situ measurement of surface roughness using chromatic confocal sensor

机译:使用彩色共焦传感器的表面粗糙度的原位测量

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Surface roughness is an important characteristic which affects the quality, performance and lifetime of many types of industrial products, ranging from mechanical and biomedical parts to semiconductors and optics. In recent years, in-situ measurement for surface roughness is increasingly demanded to provide real-time feedback and reduce systematic errors of realignment and repositioning during manufacturing. Commercially available instruments, such as stylus profilometer, confocal laser scanning microscope and coherence scanning interferometer, are limited to a relatively low measurement speed and difficult for in-situ measurement. In this paper, an in-house developed surface measuring system using chromatic confocal sensor was integrated into a mass finishing cell to perform in-situ and non-contact surface roughness measurement. The surface roughness parameters are calculated and evaluated according to ISO 4287 and ISO 4288. From the preliminary experiments, it was verified that the relative error of surface roughness measurements can be kept within 5%.
机译:表面粗糙度是一种重要的特征,影响许多类型的工业产品的质量,性能和寿命,从机械和生物医学零件到半导体和光学。近年来,对表面粗糙度的原位测量越来越需要提供实时反馈,并减少制造期间重新调整和重新定位的系统误差。市售仪器,例如触控笔轮廓仪,共聚焦激光扫描显微镜和相干扫描干涉仪,限于相对较低的测量速度,并且难以用于原位测量。本文中,使用彩色共焦传感器的内部开发的表面测量系统集成到大量整理电池中,以进行原位和非接触表面粗糙度测量。根据ISO 4287和ISO 4288计算和评估表面粗糙度参数。从初步实验中,验证了表面粗糙度测量的相对误差可以保持在5%之内。

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