...
首页> 外文期刊>The journal of high energy physics >Next-to-eikonal corrections to soft gluon radiation: a diagrammatic approach
【24h】

Next-to-eikonal corrections to soft gluon radiation: a diagrammatic approach

机译:对软胶辐射的下一次急性矫正:一种图解方法

获取原文
   

获取外文期刊封面封底 >>

       

摘要

We consider the problem of soft gluon resummation for gauge theory amplitudes and cross sections, at next-to-eikonal order, using a Feynman diagram approach. At the amplitude level, we prove exponentiation for the set of factorizable contributions, and construct effective Feynman rules which can be used to compute next-to-eikonal emissions directly in the logarithm of the amplitude, finding agreement with earlier results obtained using path-integral methods. For cross sections, we also consider sub-eikonal corrections to the phase space for multiple soft-gluon emissions, which contribute to next-to-eikonal logarithms. To clarify the discussion, we examine a class of log(1 ? x ) terms in the Drell-Yan cross-section up to two loops. Our results are the first steps towards a systematic generalization of threshold resummations to next-to-leading power in the threshold expansion.
机译:我们考虑使用FEYNMAN图方法,在下一对欧克隆秩序中考虑仪表理论幅度和横截面的软胶谐再次突出的问题。在幅度级别,我们证明了对诸如要素的贡献集的指数,并构建了有效的Feynman规则,该规则可以用于在幅度的对数中直接计算下一对敌视的排放,查找与使用路径积分获得的前面结果的协议方法。对于横截面,我们还考虑对多个软镀胶排放的相位空间的子急性校正,这有助于下一对eikonal logarithms。为了澄清讨论,我们将在Drell-yan横截面中检查一类日志(1?x)术语,最多两次循环。我们的结果是朝向阈值扩展中的阈值上面的阈值上面的阈值的第一步。

著录项

获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号